📋 JSON metadata
{
"artifact_id": "L1-152",
"chain_block": 41554229,
"chain_hash": "0xad88d8cac208f04b05bb35046a26df5e8bce02750b42484545e642dba6bfa07c",
"chain_tx_hash": "0x850345eebf6101146e85cc99b69c3d272c1428c2f46254dbac14992d8d64950f",
"domain": "Ultrafast Imaging",
"hardness_fn": {
"delta": 10,
"kappa": 640,
"metric": "PSNR_dB",
"type": "epsilon_fn"
},
"initiator_dataset": [
{
"ipfs_cid": null,
"license_hash": null,
"name": "primary",
"weight": 1.0
}
],
"layer": "L1",
"observable_profile": {
"metric": "PSNR_dB",
"regime": "Existence of the recovered 3D electron density is guaranteed within the declared Omega bounds. Uniqueness is local rather than global (non-convex landscape); convergence depends on initialisation and priors. Stability is moderately conditioned (kappa_eff ~= 32); hit_rate dominates the stability cliff; detector_dynamic_range and the remaining mismatch parameters contribute higher-order bias terms. Photon-shot-noise-limited (poisson counting) sets the irreducible data-fidelity floor, while TV / wavelet-sparsity / deep priors stabilise recovery at the ill-conditioned end of Omega.",
"secondary": "SSIM"
},
"physics_fingerprint": {
"L_DAG": 4.5,
"carrier": "x_ray",
"difficulty_delta": 10,
"domain": "Ultrafast Imaging",
"integration_axis": "angular",
"noise_model": "shot_poisson",
"primitives": [
"L.xfel_pulse",
"L.microcrystal_diffraction",
"L.bragg_indexing",
"int.spatial"
],
"problem_class": "nonlinear_inverse",
"sensing_mechanism": "xfel_serial_crystallography",
"solution_space": "3D_electron_density",
"sub_domain": "Single-pulse diffraction from microcrystals at XFEL",
"title": "XFEL Serial Femtosecond Crystallography (SFX)"
},
"size_tiers": {
"allowed_forward_operators": [
"xfel_sfx_forward"
],
"allowed_omega_dimensions": [
"N_patterns",
"H",
"W",
"pulse_fs",
"hit_rate",
"detector_dynamic_range",
"partial_reflection",
"beam_pointing_jitter",
"hit_rate",
"detector_dynamic_range",
"partial_reflection",
"beam_pointing_jitter"
],
"allowed_problem_classes": [
"xfel_sfx"
],
"center_spec": {
"epsilon_fn_center": "18.0",
"forward_operator": "xfel_sfx_forward",
"input_format": "measurement_only",
"omega": {
"H": 2048,
"N_patterns": 100000,
"W": 2048,
"beam_pointing_jitter": 0.0,
"detector_dynamic_range": 1000,
"hit_rate": 0.1,
"partial_reflection": 0.3,
"pulse_fs": 10
},
"problem_class": "xfel_sfx"
},
"epsilon_bounds": {
"psnr_db": [
5.0,
40.0
]
},
"omega_bounds": {
"H": 512,
"N_patterns": [
1000,
10000000
],
"W": 512,
"beam_pointing_jitter": [
0.0,
0.5
],
"detector_dynamic_range": [
100,
100000
],
"hit_rate": [
0.001,
0.5
],
"partial_reflection": [
0.0,
0.8
],
"pulse_fs": [
1,
100
]
}
},
"staked_pwm": 0.0,
"status": "testnet",
"sub_domain": "Single-pulse diffraction from microcrystals at XFEL",
"title": "XFEL Serial Femtosecond Crystallography (SFX)"
}