L1 ⚛ L1-143 ⊙ Testnet

SIMS — Secondary-Ion Mass Spectrometry Imaging

Spectroscopy · Mass-resolved ion imaging of surfaces

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⬇ L1-143.md

# ⚛ L1 Principle — SIMS — Secondary-Ion Mass Spectrometry Imaging **ID:** `L1-143` · **Status:** ⊙ Testnet (genesis catalog) > **🌐 Domain:** Spectroscopy — *Mass-resolved ion imaging of surfaces* > **🎯 Problem class:** linear inverse count · **🧮 Solution space:** surface chemical map > **📡 Carrier:** ion · **🌫 Noise:** shot poisson > **⚖ Difficulty (δ):** 3 · **⛓ Block:** 41554227 --- ## 🧠 1. Introduction **SIMS — Secondary-Ion Mass Spectrometry Imaging** is a **linear inverse count** whose unknown lives in **surface chemical map** space, within the **Mass-resolved ion imaging of surfaces** sub-domain of **Spectroscopy**. Measurements consist of ions detected after acceleration or extraction via a **sputter ionization** sensing mechanism. The forward operator applies, in order: S · sputter · ion operator; L · disperse · mass operator; detector accumulates flux over the exposure window. Observations are corrupted by Poisson shot noise from quantum-limited detection. Linear at low primary doses (static SIMS); Dynamic SIMS erodes sample while imaging depth. Matrix ionization-yield varies 1-3 orders of magnitude across analyte environments. ## ⚙ 2. Forward Model Physical chain: **x** → S · sputter · ion → L · disperse · mass → Temporal integration → **y** (detector). ``` y = ∫_t dt `L.disperse.mass` `S.sputter.ion` x, measurements ~ Poisson(αy) ``` **Measurement DAG:** | Primitive | What it does | |---|---| | `S.sputter.ion` | S · sputter · ion operator | | `L.disperse.mass` | L · disperse · mass operator | | `int.temporal` | Detector accumulates flux over the exposure window | ## 🔬 3. Physics Fingerprint | Property | Value | |---|---| | Domain | Spectroscopy | | Sub domain | Mass-resolved ion imaging of surfaces | | Carrier | ion | | Problem class | linear_inverse_count | | Solution space | surface_chemical_map | | Noise model | shot_poisson | | Integration axis | mass_and_spatial | | Difficulty delta | 3 | | L dag | 2.7 | ## 📡 4. Measurement Model Linear at low primary doses (static SIMS); Dynamic SIMS erodes sample while imaging depth. Matrix ionization-yield varies 1-3 orders of magnitude across analyte environments. | Metric | Value | |---|---| | Metric | concentration_NMSE | | Secondary | spatial_resolution_nm | ## 📏 5. Operating Range (Ω) **Center problem class:** `sims_surface_mapping` · **Forward operator:** `sims_forward` **Center point:** | Parameter | Unit | Value | |---|---|---| | H | px | 256 | | K | — | 10 | | W | px | 256 | | N mz | — | 10000 | | R mass | — | 10000 | | I primary na | — | 0.1 | | Matrix ionization yield | — | 0 | **Allowed bounds:** | Parameter | Unit | Range | |---|---|---| | H | px | 32 – 2048 | | K | — | 1 – 30 | | W | px | 32 – 2048 | | N mz | — | 1000 – 100000 | | R mass | — | 1000 – 100000 | | Beam drift | — | 0.0 – 0.1 | | I primary na | — | 0.001 – 10 | | Dead time saturation | — | 0.0 – 0.3 | | Mass calibration error | — | 0.0 – 100 | | Matrix ionization yield | — | 0.0 – 2.0 | ## 🎯 6. Tolerance (ε) **Center tolerance:** NMSE 0.05 | Metric | Range | |---|---| | Nmse | 0.001 – 0.5 | ## ⚖ 7. Hardness Function Hardness scales as **`epsilon_fn`** on **concentration_NMSE**, with κ = `1000` and δ = `3`. ## 💾 8. Reference Dataset - **primary** · weight 1.0 · IPFS _(not pinned yet)_ ## 9. On-chain Registration - **Chain hash:** `0x0cb3ae81ee5003d552f5dc528b1a5bc268c75d0c494c7f0ae6a85e973090c561` - **Chain tx hash:** `0x324c5397a8d87eb2560c43620a6adbff91a4fa1694880cff7c548c02db3427a5` - **Chain block:** `41554227` --- ## File Mapping This bundle consists of: `L1-143.md`, `L1-143.json`. | File | Role | How to regenerate | |------|------|-------------------| | `L1-143.md` | Source of truth — edit this | Human or LLM | | `L1-143.json` | Structured metadata for the registry | LLM regenerates from the sections above | **Prompt for your LLM after editing this Markdown:** > Read the attached Markdown. Regenerate the sibling `.json` so every field matches. > Preserve the schema documented in the rows above. > Output each file in its own fenced code block tagged with the filename. > Output only the JSON object. _This Markdown was auto-synthesized from the catalog row for `L1-143`._ _Edit it, regenerate the JSON, and submit at [/submit](/submit) to claim the artifact._

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Read the attached Markdown (L1-143.md).
Regenerate L1-143.json so every field matches the Markdown.
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L2-143-001 SIMS Imaging Surface-Mapping Spec

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📋 JSON metadata

{
  "artifact_id": "L1-143",
  "chain_block": 41554227,
  "chain_hash": "0x0cb3ae81ee5003d552f5dc528b1a5bc268c75d0c494c7f0ae6a85e973090c561",
  "chain_tx_hash": "0x324c5397a8d87eb2560c43620a6adbff91a4fa1694880cff7c548c02db3427a5",
  "domain": "Spectroscopy",
  "hardness_fn": {
    "delta": 3,
    "kappa": 1000,
    "metric": "concentration_NMSE",
    "type": "epsilon_fn"
  },
  "initiator_dataset": [
    {
      "ipfs_cid": null,
      "license_hash": null,
      "name": "primary",
      "weight": 1.0
    }
  ],
  "layer": "L1",
  "observable_profile": {
    "metric": "concentration_NMSE",
    "regime": "Linear at low primary doses (static SIMS); Dynamic SIMS erodes sample while imaging depth. Matrix ionization-yield varies 1-3 orders of magnitude across analyte environments.",
    "secondary": "spatial_resolution_nm"
  },
  "physics_fingerprint": {
    "L_DAG": 2.7,
    "carrier": "ion",
    "difficulty_delta": 3,
    "domain": "Spectroscopy",
    "integration_axis": "mass_and_spatial",
    "noise_model": "shot_poisson",
    "primitives": [
      "S.sputter.ion",
      "L.disperse.mass",
      "int.temporal"
    ],
    "problem_class": "linear_inverse_count",
    "sensing_mechanism": "sputter_ionization",
    "solution_space": "surface_chemical_map",
    "sub_domain": "Mass-resolved ion imaging of surfaces",
    "title": "SIMS \u2014 Secondary-Ion Mass Spectrometry Imaging"
  },
  "size_tiers": {
    "allowed_forward_operators": [
      "sims_forward",
      "nanosims_forward",
      "gcib_sims_forward"
    ],
    "allowed_omega_dimensions": [
      "H",
      "W",
      "N_mz",
      "I_primary_nA",
      "R_mass",
      "K",
      "matrix_ionization_yield",
      "beam_drift",
      "dead_time_saturation",
      "mass_calibration_error",
      "depth_resolution_error"
    ],
    "allowed_problem_classes": [
      "sims_surface_mapping",
      "sims_3d_depth",
      "sims_matrix_classification"
    ],
    "center_spec": {
      "epsilon_fn_center": "NMSE 0.05",
      "forward_operator": "sims_forward",
      "input_format": "ion_count_cube",
      "omega": {
        "H": 256,
        "I_primary_nA": 0.1,
        "K": 10,
        "N_mz": 10000,
        "R_mass": 10000,
        "W": 256,
        "matrix_ionization_yield": 0.0
      },
      "problem_class": "sims_surface_mapping"
    },
    "epsilon_bounds": {
      "nmse": [
        0.001,
        0.5
      ]
    },
    "omega_bounds": {
      "H": [
        32,
        2048
      ],
      "I_primary_nA": [
        0.001,
        10
      ],
      "K": [
        1,
        30
      ],
      "N_mz": [
        1000,
        100000
      ],
      "R_mass": [
        1000,
        100000
      ],
      "W": [
        32,
        2048
      ],
      "beam_drift": [
        0.0,
        0.1
      ],
      "dead_time_saturation": [
        0.0,
        0.3
      ],
      "mass_calibration_error": [
        0.0,
        100
      ],
      "matrix_ionization_yield": [
        0.0,
        2.0
      ]
    }
  },
  "staked_pwm": 0.0,
  "status": "testnet",
  "sub_domain": "Mass-resolved ion imaging of surfaces",
  "title": "SIMS \u2014 Secondary-Ion Mass Spectrometry Imaging"
}

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