📋 JSON metadata
{
"artifact_id": "L1-118",
"chain_block": 41554200,
"chain_hash": "0xcf09b2dc819f67c811fd9056d3087ec4dbd8966173db2fa3f7e6b1669f849d9d",
"chain_tx_hash": "0x07d27827c55f2a2ada2a79815290bca084c190e32e3fc9f542ff8dbf35146971",
"domain": "Industrial Inspection",
"hardness_fn": {
"delta": 3,
"kappa": 200,
"metric": "PSNR_dB",
"type": "epsilon_fn"
},
"initiator_dataset": [
{
"ipfs_cid": null,
"license_hash": null,
"name": "primary",
"weight": 1.0
}
],
"layer": "L1",
"observable_profile": {
"metric": "PSNR_dB",
"regime": "Existence of the recovered elemental concentration map is guaranteed within the declared Omega bounds. Uniqueness holds on the measurement-supported subspace; out-of-support modes are controlled by the declared priors. Stability is moderately conditioned (kappa_eff ~= 10); matrix_effect dominates the stability cliff; detector_dead_time and the remaining mismatch parameters contribute higher-order bias terms. Photon-shot-noise-limited (poisson counting) sets the irreducible data-fidelity floor, while mild Tikhonov or analytic inversion is sufficient at the nominal Omega point.",
"secondary": "SSIM"
},
"physics_fingerprint": {
"L_DAG": 3.0,
"carrier": "x_ray",
"difficulty_delta": 3,
"domain": "Industrial Inspection",
"integration_axis": "spectral",
"noise_model": "shot_poisson",
"primitives": [
"L.xray_excitation",
"L.fluorescence_emission",
"D.energy_dispersive",
"int.spectral"
],
"problem_class": "linear_inverse",
"sensing_mechanism": "xrf_characteristic_xray",
"solution_space": "elemental_concentration_map",
"sub_domain": "Elemental mapping via characteristic X-ray fluorescence",
"title": "X-Ray Fluorescence (XRF) Mapping"
},
"size_tiers": {
"allowed_forward_operators": [
"xrf_mapping_forward"
],
"allowed_omega_dimensions": [
"H",
"W",
"N_elements",
"kV",
"dwell_ms",
"peak_counts",
"matrix_effect",
"detector_dead_time",
"peak_overlap",
"matrix_effect",
"detector_dead_time",
"peak_overlap",
"self_absorption"
],
"allowed_problem_classes": [
"xrf_mapping"
],
"center_spec": {
"epsilon_fn_center": "26.0",
"forward_operator": "xrf_mapping_forward",
"input_format": "measurement_only",
"omega": {
"H": 512,
"N_elements": 10,
"W": 512,
"detector_dead_time": 0.05,
"dwell_ms": 100,
"kV": 30,
"matrix_effect": 0.0,
"peak_counts": 1000,
"peak_overlap": 0.0
},
"problem_class": "xrf_mapping"
},
"epsilon_bounds": {
"psnr_db": [
5.0,
40.0
]
},
"omega_bounds": {
"H": [
64,
4096
],
"N_elements": [
2,
30
],
"W": [
64,
4096
],
"detector_dead_time": [
0.0,
0.5
],
"dwell_ms": [
1,
10000
],
"kV": [
10,
50
],
"matrix_effect": [
0.0,
0.3
],
"peak_counts": [
20,
100000
],
"peak_overlap": [
0.0,
0.5
],
"self_absorption": [
0.0,
0.5
]
}
},
"staked_pwm": 0.0,
"status": "testnet",
"sub_domain": "Elemental mapping via characteristic X-ray fluorescence",
"title": "X-Ray Fluorescence (XRF) Mapping"
}