📋 JSON metadata
{
"artifact_id": "L1-111",
"chain_block": 41554199,
"chain_hash": "0x7b559b400db1df155a398cb129f8e36a0278ccc22d8a27905ead9b4e0641ce27",
"chain_tx_hash": "0x100aad798be7b7621886dff4347810c1c3dc6bf1934b65809a7b6f0378d8d6c0",
"domain": "Industrial Inspection",
"hardness_fn": {
"delta": 5,
"kappa": 360,
"metric": "PSNR_dB",
"type": "epsilon_fn"
},
"initiator_dataset": [
{
"ipfs_cid": null,
"license_hash": null,
"name": "primary",
"weight": 1.0
}
],
"layer": "L1",
"observable_profile": {
"metric": "PSNR_dB",
"regime": "Existence of the recovered 3D attenuation is guaranteed within the declared Omega bounds. Uniqueness holds on the measurement-supported subspace; out-of-support modes are controlled by the declared priors. Stability is moderately conditioned (kappa_eff ~= 18); beam_hardening dominates the stability cliff; scatter and the remaining mismatch parameters contribute higher-order bias terms. Photon-shot-noise-limited (poisson counting) sets the irreducible data-fidelity floor, while TV / wavelet-sparsity / deep priors stabilise recovery at the ill-conditioned end of Omega.",
"secondary": "SSIM"
},
"physics_fingerprint": {
"L_DAG": 3.8,
"carrier": "x_ray",
"difficulty_delta": 5,
"domain": "Industrial Inspection",
"integration_axis": "angular",
"noise_model": "shot_poisson",
"primitives": [
"L.xray_source",
"S.scan.angular",
"L.beer_lambert",
"L.backproject",
"int.angular"
],
"problem_class": "linear_inverse",
"sensing_mechanism": "xray_ct",
"solution_space": "3D_attenuation",
"sub_domain": "Micro-/nano-CT non-destructive inspection",
"title": "Industrial Computed Tomography (high-res x-ray CT for NDT)"
},
"size_tiers": {
"allowed_forward_operators": [
"industrial_ct_forward"
],
"allowed_omega_dimensions": [
"H",
"W",
"Z",
"N_projections",
"kV",
"pixel_um",
"photon_count_per_ray",
"beam_hardening",
"scatter",
"misalignment",
"beam_hardening",
"scatter",
"ring_artifact",
"misalignment"
],
"allowed_problem_classes": [
"industrial_ct"
],
"center_spec": {
"epsilon_fn_center": "28.0",
"forward_operator": "industrial_ct_forward",
"input_format": "measurement_only",
"omega": {
"H": 2048,
"N_projections": 720,
"W": 2048,
"Z": 512,
"beam_hardening": 0.0,
"kV": 150,
"misalignment": 0.0,
"photon_count_per_ray": 10000,
"pixel_um": 50,
"scatter": 0.0
},
"problem_class": "industrial_ct"
},
"epsilon_bounds": {
"psnr_db": [
5.0,
40.0
]
},
"omega_bounds": {
"H": [
512,
8192
],
"N_projections": [
180,
4320
],
"W": [
512,
8192
],
"Z": [
64,
4096
],
"beam_hardening": [
0.0,
0.3
],
"kV": [
20,
450
],
"misalignment": [
0.0,
5.0
],
"photon_count_per_ray": [
100,
100000
],
"pixel_um": [
0.5,
500
],
"ring_artifact": [
0.0,
0.2
],
"scatter": [
0.0,
0.4
]
}
},
"staked_pwm": 0.0,
"status": "testnet",
"sub_domain": "Micro-/nano-CT non-destructive inspection",
"title": "Industrial Computed Tomography (high-res x-ray CT for NDT)"
}